The powerful KT GenII ICT guarding measurement amplifier represents one of the key components of the KT-ICT platform. Precise measurement of electronic components is achieved with switching matrices and a precise 16-bit measurement data acquisition card in a PXI chassis.

The options include the following measurement functions: 

• resistors
• capacitors
• coils
• impedance measurement
• diode testing
• transisitor testing
• Zener diode testing
• continuity testing
• short circuit testing
• 2-wire and 4-wire measurements
• any number of guarding points

The device was implemented as a 3HU PXI card and can be used in any standard PXI chassis. An National Instruments M series card is preferably used for the digitalization of measurement data. Two cards are currently intended as switching matrices:

• KT-AM-301 (topology e.g. 172x4; used in the KT-ABex system)
• NI-2532      (topology e.g. 128x4)

Another feature of the ICT amplifier is the connection of a pin finder for fast localization of the associated test pin when commissioning the test adapter.

Several ICT amplifiers can be operated in parallel. Such configurations lead to an increase in cycle times, because parallel and fully independent components can be measured.

Links and Downloads:

Data sheet KT GenII ICT Amplifier