Under the theme "Trends, challenges and solutions for automated test systems" Konrad Technologies and National Instruments held their annual ATE Technology Day on 12 May 2011. In Sindelfingen about 150 participants came together to discuss current issues in the ATE industry. The conference program included two parallel tracks with presentations about functional test, in-circuit test, boundary-scan test, RF test and semiconductor test.

In the final panel discussion, moderated by Hilmar Beine, editor of the Productronic magazine (Hüthig-Verlag), discussed leading representative of Konrad Technologies, National Instruments and Noffz computer systems over the topic of overall cost optimization by taking advantage of synergies of different test philosophies.

Modular, universal testing concepts, such as the Abex platform introduced by Konrad Technologies take an increasingly important position on a market. As such, the latest mixed-signal test system KT-7500 Finn is based substantially on standard components from the market. This include PXI instruments and FPGA boards which are supplemented by Konrad's application know-how regarding docking solutions and real-time requirements in semiconductor test. In the presented ABex system alliance partners and interested third parties are invited to collaborate with Konrad Technologies on the further development of the open PXI extension ABex.

Links and Downloads

www.abexstandard.org

Konrad Presentations at the ATE Technology Day 2011 (German)

Main page of the ATE Technology Day 2011 (German)