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NIWeek 2011
Visit us in Austin, Texas at the NIWeek 2011 - the biggest worldwide conference and exhibition on Graphical System Design... more



Semicon West 2011 Review
Konrad Technologies and National Instruments showed the latest generation Mixed-Signal Tester KT-FINN 7500 on the Semicon West 2001. more



Review ATE Technology Day 2011
Under the theme "Trends, challenges and solutions for automated test systems" Konrad Technologies and National Instruments held their annual ATE Technology Day on 12 May 2011. In Sindelfingen about... more

New: Semiconductor Test Video

Watch this video and learn about the most important features of semiconductor testing using the KT-FINN platform. Raj Puri explains the architecture and talks about its use in mixed-signal and protocol aware test.

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New: Radio-Control Car Key Tester

Durability test system for automotive car keys. Parallel test of eight DUTs in a climate chamber. AM and FM modulated signal transmission.

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New: Automotive Radar Tester

RF test system for blind spot detection and other automotive radar systems. Allows In-Circuit and functional test.

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New: Tester for Large Diesel ECUs

EOL test system for large Diesel ECUs with injection. Testing of power output stages under loads of up to 150V, 25A burst with HiPex High-current load multiplexer.

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:: Functional Test