Konrad Technologies is your ideal partner for solutions in semiconductor testing and accompanies your products from the first design validation, characterization through to beyond production.

Assemblies with semiconductor chips can be tested with our functional and in-circuit test systems. All systems share one common software and hardware architecture. Our configurable test systems are based on off the shelf instruments, which can be used in the test configuration according to the application. So it is easy to cover the requirements for various applications, such as digital, analog, automotive, mixed signal, SoC, RF and MEMS. The flexible architecture allows simply implementation of test solutions from classical pattern of digital tests as well as RF and analog tests and even protocol aware tests.

KT-7000 FINN Test System Platform

• KT-7100 At-Speed Adaptive Tester with Data Streaming
• KT-7200 Protocol Aware Tester
• KT-7300 MEMS Tester
• KT-7400 Automotive Tester - Low Side Switches
• KT-7500 Mixed Signal Tester

Among these activities we are involved in a consortium of multiple partners from industry and research institutes for the development of a generic PXI-based tester platform for the semiconductor test. For this reason the research project OKTOPUS has been initiated.

Links and Downloads:

Test System Platform KT-7000 FINN

Research Project OKTOPUS

(currently German only)