(BMBF, FKZ: 01M3182E, Bestandteil des Förderprogramms IKT 2020)

Objective

Project OKTOPUS stands for „Optimal-Konfigurierbare Test-Organisationsplattform mit Unterstützung der Synthese" (optimal configurable test organisation platform with synthesis support). In the course of this, Konrad Technologies explores, together with other research partners, future-oriented modular test concepts. Primary objective of this project is the research and study of a test platform which incorporates the hardware framework, software environment and test development methodology.

The main characteristic of the test architecture, scalability, should facilitate adjustment and adaptation of the equipment to changing demands, without having to leave the platform. Going from a pre-configured over-sized tester to a user-specific modular test system promises a decrease of your test costs. Other performance features include a investment security, provided by the versatile applicability of the modules from numerous suppliers, in accordance with the industry standard, automatic system configuration, as well as support for the test synthesis. The migration from laboratory to production floor is of particular importance, as the progresses in testing methods can now be applied under production-relevant conditions.

Project Partners

• IMMS GmbH (Ilmenau)
• University of Nürnberg-Erlangen,
  Chair of Computer-Aided Circuit Design
• University of Nürnberg-Erlangen,
  Chair for Microwave Engineering and High Frequency Technology
• Atmel Germany GmbH (Heilbronn)
• Melexis GmbH (Erfurt)
• X-FAB Semiconductor Foundries AG (Erfurt)

Roadmap

OKTOPUS war started in June 2007 and runs until May 2010. In the years to come, concepts for a modular test platform will be developed. At the same time, research will focus on exploring the potential of optimising these concepts in order to create cost-efficient tests. Tester modules are available on the market, but not the adaptation to the test sample. This is the top priority on the way to operational test systems. Here, the market demands new concepts which can route test resources flexibly and with high signal quality. This adjustment for applications in microelectronics must be evaluated and characterised. Further on, research will focus on selftest and calibration strategies.

Contact Person

Armin Lechner: Tel: +49 7732 9815-0